New Product Demonstrations at Sea Air Space Conference 2014

At the 2014 Sea Air Space Show in Maryland, April 7 – 9, United Electronic Industries (UEI) will demonstrate the newly released DNR-MIL and DNA-Mil Data Acquisition and Embedded Control Chassis. These Mil-Grade platforms are ruggedized, performance optimized, designed to meet key elements of MIL-STD-461/810/1275 and guaranteed to withstand 5 g vibration and 100 g shock for the most environmentally challenging I/O applications.

The 2014 Sea Air Space Exposition will be held on April 7-9 at the Gaylord National Convention Center in National Harbor, MD.

The 2014 Sea Air Space Exposition will be held on April 7-9 at the Gaylord National Convention Center in National Harbor, MD.

Configurable as either a stand-alone or computer-hosted system, these I/O test and embedded control instruments are 100% COTS solutions, meaning they are modular and customizable for handling any analog, digital, interface, sensor/transducer input or output. Their rugged IP66/NEMA6 sealed chassis allow for in-field deployments without any additional enclosure or protection required.

For long-life I/O systems like Line Replaceable Units (LRUs) and VME-based systems that will soon face end-of-life availability issues, UEI guarantees at least 10 years of post-purchase product availability. Extensive software support includes all popular OS, RTOS and DAQ (data acquisition) applications, including Linux, VxWorks, Windows, MATLAB, Simulink, QNX and RTX to name a few.

The new DNA-MIL and DNR-MIL platforms are designed for MIL-STD-461/810/1275 compliance and for environmentally harsh I/O acquisition and control applications.

The new DNA-MIL and
DNR-MIL platforms are designed for MIL-STD-461/810/1275
compliance and for environmentally harsh I/O acquisition and control applications.

Much like it’s predecessor systems, the DNX-MIL products are made in the USA and supported by UEI’s extensive line of of analog, digital and interface I/O boards for thermocouples, RTDs, ICP/IEPE, ARINC-429, AFDX, MIL-STD-1553, CANbus, RVDT/LVDT, synchro/resolver, RS 232/422/485 strain gauge, quadrature encoder, high-voltage analog outputs, high drive current, analog inputs up to 24-bits, arbitrary waveform generation and much more.

For the most robust I/O connectivity with on-board Built-In-Test (BIT) diagnostics to ensure maximum uptime and failsafe operation, the DNx-MIL Chassis can’t be beat.  Give us a call for more details.

Piezoelectric Sensor

Piezoelectric crystals have an interesting property that make them unique and powerful as a sensor. On the sensor side, when a piezoelectric crystal is deformed, it generates an output EMF (Electromagnetic Field). This characteristic is the basis for the vast majority of vibration sensors as well as many popular audio input sensors.

The industry standard for this type of sensor is a two-wire interface that, depending on the manufacturer, may be called ICP, IEPE or a variety of other names.

The DNA-AI-211 4-channel IEPE / ICP Vibration Sensor Interface

The DNA-AI-211 4-channel IEPE / ICP Vibration Sensor Interface

The common thread is that the two-wire interface provided power via a constant current source (typically between 1 mA and 4 mA) and then returns the output voltage on top of the current source. See the DNA-AI-211 as an example of a four-channel ICP/IEPE interface.

MIL-Grade DAQ & I/O Control Chassis Make Debut

DNx-MIL SeriesTwo new rugged DAQ (Data Acquisition) and I/O Control platforms promise military-grade reliability and COTS configurability. The DNR-MIL and DNA-MIL are designed for MIL-STD-461/810/1275 compliance and deployment in harsh environments involving military and aerospace computing, oil drilling platforms and storage refineries, heavy machinery, outdoor test stands and other I/O applications. Both platforms offer several technological advantages, including the ability to create a configurable COTS-based solution for virtually any analog/digital I/O sensor, interface and control application.

Learn more.

Is Your VME-based I/O System Going EOL?

Reflective Memory in VME chassis has long been the standard in real-time DAQ and embedded control systems. However, due to the age of most VME systems, as well as the recent consolidation of vendors in the market, many VME users will soon face EOL (end-of-life) issues.

Learn more about moving on from obsolete VME.

COLBERT Treadmill Uses UEIPAC Controller

TV personality Stephen Colbert used his show The Colbert Report to encourage his viewers to write in votes to name the space station's treadmill COLBERT, short for Combined Operational Load Bearing External Resistance Treadmill.

TV personality Stephen Colbert used his show The Colbert Report to encourage his viewers to write in votes to name the space station’s treadmill COLBERT, short for Combined Operational Load Bearing External Resistance Treadmill.

NASA selected United Electronics Industries’ UEIPAC Cube (shown below) for controlling the Combined Operational Load Bearing External Resistance Treadmill (COLBERT) treadmill in the space station’s exercise deck. The treadmill is commonly abbreviated TVIS, for its Treadmill Vibration Isolation Stabilization system, allowing astronauts to run without treadmill vibrations affecting the spacelab’s delicate microgravity science experiments.

Read the full story.

Quick Lesson in Non-Linearity

As its name implies, non-linearity is the difference between the graph of the input measurement versus actual voltage and the straight line of an “ideal” measurement. The non-linearity error is composed of two components, integral non-linearity (INL) and differential non linearity (DNL). Of the two, integral non-linearity is typically the specification of importance in most data acquisition (DAQ) systems.

INL is the maximum deviation between the ideal output of a DAC and the actual output level (after offset and gain errors have been removed).

INL is the maximum deviation between the ideal output of a DAC and the actual output level (after offset and gain errors have been removed).

INL: The specification is commonly provided in “bits” and describes the maximum error contribution due to the deviation of the voltage versus reading curve from a straight line. Though a somewhat difficult concept to describe textually, INL is easily described graphically and is depicted in Figure 4. Depending on the type of A/D converter used, the INL specification can range from less than 1 LSB to many, or even tens, of LSBs.

DNL: Differential non-linearity describes the “jitter” between the input voltage differential required for the A/D converter to increase (or decrease) by one bit. The output of an ideal A/D converter will increment (or decrement) one LSB each time the input voltage increases (or decreases) by an amount exactly equal to the system resolution.

DNL is the deviation between two analog values corresponding to adjacent input digital values.

DNL is the deviation between two analog values corresponding to adjacent input digital values.

For example, in a 24-bit system with a 10-volt input range, the resolution per bit is 0.596 microvolt. Real A/D converters, however, are not ideal and the voltage change required to increase or decrease the digital output varies. DNL is typically ±1 LSB or less. A DNL specification greater than ±1 LSB indicates it is possible for there to be “missing” codes. Though not as problematic as a non-monotonic D/A converter, A/D missing codes do compromise measurement accuracy.

Check out UEI’s Master Class Videos on Youtube.

Storage Tank Monitoring

The recent spill of methylcyclohexane methanol into the Elk River in West Virginia serves as a reminder that our older storage tank systems need frequent inspections and infrastructure updates. Better monitoring systems can reduce the impact of such spills on our natural resources and the people who depend on them. Fortunately, the distributed nature of United Electronic Industries’ I/O platforms are well suited for monitoring temperatures, pressures, strain and thermal expansion in large storage tank facilities.

Storage tanks require rugged monitoring systems like that of UEI's GigE Cube.

Storage tanks require rugged monitoring systems like that of UEI’s GigE Cube.

UEI’s platforms are perfectly suited for a variety of applications, including spent nuclear fuel rod containment tanks, petroleum and gas refinery tanks, wastewater treatment chambers, and fluid separation basins that require industrial-strength monitoring systems.

Our PowerDNA Cube, for example, effectively collects measurements taken by thermocouples, pressure transducers and various strain gauges and load cells. Stand-alone data recorder/logger functionality allows data to be stored locally, ensuring no data is lost even if the network is temporarily disabled. The new teaming/bonding support on our new GigE Cube provides for simple connections to redundant networks as required. Equally important, our 10-year availability guarantee ensures that environmentally sensitive tank monitoring systems are easy to maintain and monitor over many, many years.

Temperature Effects in Strain Measurement

Temperature adversely impacts strain measurements in many ways, though three are of primary concern:
• The device or object studied will almost always have a non-zero coefficient of thermal expansion. Unless compensated for, changes in temperature will cause the item to which the strain gauge is attached to expand or contract, which is then indicated as a change in strain.
• The materials of the strain gauge itself have a non-zero coefficient of thermal expansion. Changes in temperature will cause the strain gauge itself to expand or contract, independent of any strain in the part to which it is attached.
• The wiring and the strain gauge itself will have a non-zero Temperature Coefficient of Resistance. That is, as the temperature changes, the resistance of the strain gauge and connecting wires will change independently of any change in strain. (For example, copper wire resistance changes at approximately 3,900 ppm per °C (.393% /°C).)

Some texts treat the first two items as the same effect. After all, if the coefficients of expansion of the gauge and the item under test are the same, they will contract or expand at the same rates in response to a temperature change. In this case, a change in system temperature would not cause any change in the indicated strain, except that based on the gauge’s temperature coefficient of resistance.

It’s important to note that in some applications, it may be desirable or even critical that strain induced by temperature changes be noted. Imagine an application where a “hot section” turbine blade is being tested to ensure proper clearance between the blade tip and the surrounding shroud. It’s important to know how much the blade has elongated based upon temperature in addition to the centrifugal force of rotation. On the other hand, if the parameter of interest is really stress, or its close relative, force, any strain caused by temperature changes would induce a true error in the result. A strain gauge used to measure the “g” forces on a supersonic aircraft wing skin might see temperatures from -45°C to +200°C. If the g-force information was critical to not overstressing the wing, you’d certainly not want significant temperature-induced error. In a more simple case, the load cell used to measure the force placed on a postal scale should not induce errors simply because the scale is next to the window on a sunny summer day!

Most applications fall into the second category, where the key measurement parameter is really stress, and the ideal system would be not to recognize any changes caused by thermal expansion or contraction. Like most engineering challenges, there is more than one way to skin this proverbial cat. They are: (1) Calculate the error and eliminate it mathematically, (2) Match the strain gauge to the part, (3) Use an identical strain gauge in another leg of the bridge. We’ve previously covered how to eliminate it mathematically, so lets take a closer look at choices 2 and 3.

Match the Strain Gauge to the Part Tested
The use of different alloys/metals allows manufacturers to provide strain gauges designed to match the thermal expansion/contraction behavior of a wide variety of materials commonly subject to strain (and stress) testing. This type of gauge is referred to as a “Self Temperature Compensated” (or STC) strain gauge. These STC gauges are available from a variety of manufacturers and are specified for use on a wide assortment of part materials. As you might imagine, the more common a metal, the better the chances are there is an STC gage that matches. However, you may count on being able to find a good match for such materials as aluminum, brass, cast iron, copper, carbon steel, stainless steel, titanium and many more. Though the match between the STC gauge and the part under test may not be perfect, it will typically be accurate enough from freezing to well past the boiling point of water. For more details on the precise accuracy to expect, you should contact your strain gauge manufacturer.

Use an Identical Strain Gauge in Another Leg of the Bridge
Due to the ratiometric nature of the Wheatstone bridge, a second, unstrained gauge (often referred to as a “dummy” gauge) placed in another leg of the bridge will compensate for temperature induced strain. Note that the dummy gauge should be identical to the “measuring” gauge and should be subject to the same environment.

Strain gauges tend to be small, and have short thermal time constants (i.e., their temperature changes very quickly in response to a temperature change around them), while the part under test may have substantial thermal mass and may change temperature slowly. For this reason, it is good practice to mount the dummy gauge adjacent to gauge being measured. However, it should be attached in such a way as not to be subjected to the induced strain of the tested part. In some cases, with relatively thin subjects and when measuring bending strain (as opposed to pure tensile or compressive strain), it may be possible to mount the dummy gauge on the opposite side of a bar or beam. In this case, the temperature impact of the gauges is eliminated and the scale factor of the output is effectively doubled.

Quarter, Half and Full Bridges
Strain gauges and measurement devices based upon strain gauges (e.g., load cells) can be configured in three different configurations. These are referred to as Quarter, Half and Full Bridges.

Quarter Bridge Strain Gauge

Quarter Bridge Strain Gauge

The quarter bridge gauge shown above is the simplest and probably most common strain gauge con-figuration (though some devices “based” on strain gauges are more likely to be provided in half or full bridge). The name “quarter” comes from the fact that in this configuration, the strain gauge represents one out of four, or one quarter of the resistors in the Wheatstone bridge. In this configuration, the user must supply the other three resistors.

Half Bridge Strain Guage

Half Bridge Strain Guage

In the half-bridge configuration, two resistors or half of the bridge are provided in the strain gauge itself. Half Bridge configurations have two advantages over the single bridge. First, they simply require the user to provide one less resistor. Second and more important, however, is the fact that most half bridge sensors automatically provide temperature compensation, made possible by having two identical gauges in the same side of the bridge.

As you might expect, the full bridge sensor shown below provides all four resistors, in effect, providing the entire bridge. All the measurement system needs to provide is an excitation voltage and a differential analog input. Like the half-bridge configuration, most full bridge gauges are temperature compensated.

Learn more about measuring output from a strain gauge.

Full Bridge Strain Guage

Full Bridge Strain Guage

Acceleration, Velocity and Displacement Sensors

Accelerometers are widely used to measure motion and vibration in rotating machinery, vehicles, aircraft, and in all kinds of other structures. Virtually all accelerometer devices use the force generated by moving a seismic mass to measure acceleration of the mass. The displacement of the mass or the force developed by the motion of the mass can be detected and measured by a number of different sensors, such as electromagnetic, electrostatic, magnetic reluctance, inductive (LVDT), piezoelectric, piezoresistive, potentiometric, capacitance, strain gauge, servo force-balance and motion balance, and micromachined semiconductors (MEMS).

Logarithmic Relationship Between Acceleration, Velocity, and Displacement

Logarithmic Relationship Between Acceleration, Velocity, and Displacement

New types of accelerometers and integrated sensor systems are quickly replacing more traditional vibration sensors for a number of reasons, including lower cost, better performance, rugged design, and smaller size. These new devices offer increased sensitivity, a wider range of operating frequencies, and much wider range of application in industry.

For some applications such as monitoring of the health of a rotating machine, velocity or displacement measurement are preferred over acceleration sensing. Since velocity is the first derivative of displacement vs. time, and acceleration is the derivative of velocity, both measurements can be calculated from acceleration by integrating the signal once or twice or by using the logarithmic relationships between acceleration, velocity, and displacement as illustrated in the Figure above.

Learn more about UEI’s HUMS solutions.